- Technical Details
Microsphere Imaging - A new era of optical microscopy
NANOPSIS’ super-resolution microsphere amplifying lens (SMAL) enables users to expand the reach of white-light optical microscopy past the diffraction limit of light* (200 nm) and into super-resolution. Our patented microsphere* lens amplifies the power of light, allowing our white-light nanoscope to resolve lateral features of 50 nm in size. With SMAL, users can access super-resolution imaging with all the benefits of optical microscopy - it is quick, easy, non-destructive, in the lab, and in full,real colour. We aim to make super-resolution imaging accessible to all, with no need for expensive environmental equipment, or extensive sample preparation - it’s just light, glass, and a camera.
World leading optical resolution
50 nm lateral resolution allows you to go beyond the diffraction limit of light. With SMAL, you can see the nanoscopic world like never before.
The nanoscopic world in full colour
Seeing is believing. With SMAL you can see the nanoscopic world as it is, in full, real colour. Unlike an SEM, TEM, or AFM, we are not reconstructing a super-resolution image,
what you see is what you get.
Accessible to anyone, anywhere
Unlike other super-resolution imaging techniques, SMAL does not require expensive environmental conditions. It works at room temperature, without the need of a vacuum. Furthermore, SMAL does not require extensive sample preparation. So long as the sample is relatively level, flat, and smooth, SMAL works without sputtering or coating on both metallic and non-metallic samples, with nothing but water as an immersion medium.
On the left is an example of SMAL imaging vs. brightfield optical microscopy with a 100x oil immersion lens. Note the dramatic increase in both resolution and magnification.
50 nm Lateral resolution
Here you can see how the NANOPSIS M is able to resolve lateral gaps of 50 nm, far beyond the reaches of standard optical microscopy.
Here you can see a comparison between standard optical microscopy and SMAL microscopy while observing Semiconductor samples